Please use this identifier to cite or link to this item: http://bura.brunel.ac.uk/handle/2438/15259
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dc.contributor.authorByzyka, J-
dc.contributor.authorChamberlain, D-
dc.contributor.authorRahman, M-
dc.date.accessioned2017-10-12T12:54:04Z-
dc.date.available2017-10-12T12:54:04Z-
dc.date.issued2017-
dc.identifier.citationProceedings of the ICE - Transporten_US
dc.identifier.issn0965-092X-
dc.identifier.urihttp://bura.brunel.ac.uk/handle/2438/15259-
dc.description.abstractThe performance of hot-mix asphalt patch repair is greatly reduced due to inferior compaction at the interface. It is known that the faster loss of temperature at the interface is one of the primary reasons for inferior compaction. A novel Controlled Pothole Repair System (CPRS) has been developed as part of this study. The CPRS uses infrared heating technology with enhanced features compared to many existing infrared systems. In parallel, a three dimensional finite element thermal model capable of modelling the loss of temperature during patch repair process has been developed. The first part of the paper presents the functionality of CPRS including experimental results to demonstrate various features of the system. In the second part, the numerical results are compared against experimentally measured values from a patch repair in a controlled laboratory condition. The tests are done to measure the influence of no preheating and preheating of the existing surface on the temperature loss. The results showed more than 80% agreement between simulation and actual measurements. It also shows, preheating of the existing surface can significantly reduce temperature loss at the interface, thus allowing more time for repair and the possibility of achieving better compaction.en_US
dc.language.isoenen_US
dc.subjectRoads & highwaysen_US
dc.subjectthermal effectsen_US
dc.subjectfailureen_US
dc.titleDevelopment of advanced temperature distribution model in hot mix asphalt patch repairen_US
dc.typeArticleen_US
dc.relation.isPartOfProceedings of the ICE - Transport-
pubs.publication-statusAccepted-
Appears in Collections:Dept of Electronic and Computer Engineering Research Papers

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